Moving from exploratory to confirmatory network analysis: An evaluation of SEM fit indices and cutoff values in network psychometrics

Du X., Skjerdingstad N., Freichel R., Ebrahimi OV., Hoekstra RHA., Epskamp S.

DOI

10.31234/osf.io/d76ab_v2

Type

Preprint

Publication Date

2025-02-07T00:00:00+00:00

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